Phase shift imaging in thin films using CW Z-scan based technique

The beam waist relative variation (BWRV) method known as a Z-scan based technique is used to demonstrate its feasibility in characterizing the thermal effects induced by continuous laser different materials. A study of several classical solvent-based solutions (water, ethanol, methanol …) carried out before introducing extension BWRV laterally map tested sample. We show that transverse xy-scan sample allows extract an image phase shift due local heating. This new device, called XYZ-scan, designed for characterization inhomogeneous samples. An example will be given on 1.6μm thick thin film doped with silver nanoparticles.